Test Contactor
For Wafer Probe Test Application
For wafer probing where high RF performance is required, Yokowo offers probe heads with unique coaxial structure. Yokowo has electrical simulation capability to propose and validate optimized solution for each customer.
Features
Features
Super Sharp Tips
Lower-Force Probes
Large Compliance Windows
Fine Pitch Kelvin Probes
Large Compliance Windows
Dimensionaly-Stable Contactor Materials
Mechanicaly Simulation Capabilities