Test Contactor
			  
			              For Wafer Probe Test Application
			  
            For wafer probing where high RF performance is required, Yokowo offers probe heads with unique coaxial structure. Yokowo has electrical simulation capability to propose and validate optimized solution for each customer.
			Features
			             
			  Features
			  Super Sharp Tips
			  Lower-Force Probes
			  Large Compliance Windows
			  			  Fine Pitch Kelvin Probes
			  			  Large Compliance Windows
			  Dimensionaly-Stable Contactor Materials
			  			  Mechanicaly Simulation Capabilities