Wafer Probe Test Pins

Test Contactor | Probe Head Solutions

Wafer Probe Test Pins

Test Contactor

For Wafer Probe Test Application

For wafer probing where high RF performance is required, Yokowo offers probe heads with unique coaxial structure. Yokowo has electrical simulation capability to propose and validate optimized solution for each customer.

Features


Features

  • Super Sharp Tips
  • Lower-Force Probes
  • Large Compliance Windows
  • Fine Pitch Kelvin Probes
  • Large Compliance Windows
  • Dimensionaly-Stable Contactor Materials
  • Mechanicaly Simulation Capabilities
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